典型的JEDEC可靠性测试要求（简化版）：
|
Test Items |
Description |
Requirements |
Number of Chips from 3 lots each |
|
HTGB |
High Temperature Gate Bias |
168h |
77 |
|
HTRB |
High Temperature Reverse Bias |
168h |
77 |
|
Temp. Cycles |
Temperature Cycling Tests |
-65°C / +150°C, 500 cycles, dwell time: 10-15minutes |
77 |
|
PCT |
Pressure Cooker Test |
96h,T=121°C；RH=100% |
77 |
|
THB |
Temperature, Humidity, Bias Tests |
1000h with bias |
77 |
|
HTS |
High Temperature Storage |
150°C，1000hrs |
77 |
